PRODUCTS
Wafer Tester
Memory Tester at Wafer Level
DF-5200(HBM3E)
SPECFICATION
| UNIT | ITEM | DF-5200 | |||
|---|---|---|---|---|---|
| CPU | Q'ty | 96 | |||
| FLASH | 128Mbyte | ||||
| RAM | 8Gbyte | ||||
| TG | SPEED | 220Mhz | |||
| TEST RATE | 4.5ns | ||||
| RESOLUTION | 78ps | ||||
| PG | PATTERN LENTH | 8K | |||
| USER MEMORY | UBM | 32K/IO | |||
| DBM | 4M/72bit | ||||
| FAIL MEMORY | FM SERVER(512GB) x 4 | ||||
| RA MEMORY | |||||
| DPS | CURRENT | 1.4A / 2560 | |||
| PROBE CARD | SIZE | 520 Pi | |||
| DUT | PARALLEL | 3072 | |||
| CHANNEL | IO | 6144 | |||
| DRV | 2816 | ||||
| L-DRV | 2944 | ||||
| TARGET DEVICE | DDR,LPDDR,HBM | ||||
In development
Memory Tester & Burn In Systems at Wafer Level
DF-8000/8100/8400
The DF-8000/8100/8400 and DF Series Memory Wafer test & Burn In Systems,
are designed to provide full function wafer Test and Burn In solution.
with its 40Mhz/10Mhz frequency.
SPECFICATION
| UNIT | ITEM | DF-8000 | DF-8100 | DF-8400 | |
|---|---|---|---|---|---|
| CPU | Qty | - | 28ea | 36ea | |
| FLASH | 8GByte | ||||
| RAM | 1GByte | ||||
| TEST HEAD | COUNT | 2 | 1 | 1 | |
| TG | SPEED | 10Mhz | 10Mhz | 40Mhz | |
| TEST RATE | 100ns ~ 40.96㎲ | 25ns ~ 10ms | 25ns ~ 10ms | ||
| RESOLUTION | 10ns | 1ns | 1ns | ||
| PG | PATTERN LENTH | 512 | 2K | ||
| USER MEMORY | UBM | - | 16Kbit / IO | ||
| DBM | - | 32Mbyte | 16Mbyte | ||
| FAIL MEMORY | - | 144Gbit/Sys | 224Gbit/Sys | ||
| RA MEMORY | - | 144Gbit/Sys | 224Gbit/Sys | ||
| DPS | CURRENT TYPE | 800mA | |||
| PROBE CARD | SIZE | 440pi POGO | 480pi ZIF | 440pi ZIF | |
| DUT | PARALLEL | 228 | 224 | 288 | |
| CHANNEL | IO | 2304 | 1792 | 1792 | |
| DRV | 576 | 2016 | 2016 | ||
| HC DRV | 576 | 224 | 224 | ||
| HV DRV | - | 896 | 896 | ||
| HC/HV | 576 | - | - | ||
| R/B | - | 224 | 224 | ||
| POWER | DPS | - | 448 | 288 | |
| TARGET DEVICE | DRAM , SRAM, FLASH(NAND, NOR) | DRAM, NAND FLASH | |||
Memory Tester at Wafer Level
DF-8600
The DF-8600 and DF Memory Test Systems are designed to provide full functional wafer
testing soultion.With its 100Mhz high speed testing frequency,users can get several
adavntages.
SPECFICATION
| UNIT | ITEM | DF-8600 (36SITE) | |||
|---|---|---|---|---|---|
| CPU | Qty | 5EA / 1SITE x 36SITE = 180EA | |||
| FLASH | 8GByte | ||||
| RAM | 1GByte | ||||
| TG | SPEED | 100Mhz | |||
| TEST RATE | 10ns ~ 5ms | ||||
| RESOLUTION | 200ps | ||||
| PG | PATTERN LENTH | 4K | |||
| USER MEMORY | UBM | 16Kbit / IO | |||
| DBM | 64MByte | ||||
| FAIL MEMORY | 2,304Gbit / SYSTEM | ||||
| RA MEMORY | 2,304Gbit / SYSTEM | ||||
| DPS | CURRENT TYPE | 1.2A or 400mA | |||
| PROBE CARD | SIZE | 440, 480, 520pi FLEXIBLE | |||
| DUT | PARALLEL | 1152 | |||
| CHANNEL | IO | 4608 | |||
| DRV | 576 | ||||
| HV DRV | 120mA : 288EA or 15mA : 2,304EA | ||||
| POWER | DRAM, NAND FLASH, etc | ||||
